电子元器件应用-Agilent T150 UTM Data Sheet
Features and Benefits
? Nanomechanical actuating transducer head functions as a load cell to deliver high sensitivity over a large range of strain
? Dynamic properties characterization mode provides precise accuracy throughout testing ? Flexible, upgradeable universal testing machine can be con? gured for repeatable speci? c applications or a variety of new applications ? Outstanding software offers
real-time experimental control and easy test protocol development Applications
? Yield of compliant ? bers and biological materials
? Dynamic studies of ? bers and biological materials
? Tensile and compression studies
of polymers Overview
The Agilent T150 UTM is a universal testing machine that offers researchers a superior means of nanomechanical characterization. The state-of-the-art T150 employs a nanomechanical actuating transducer head to produce tensile force (load on sample) using electromagnetic actuation combined with a precise capacitive gauge, delivering outstanding sensitivity over a large range of strain.
The T150 UTM enables researchers to understand dynamic properties
of compliant ? bers via the largest dynamic range in the industry and the best resolution on the market (? ve orders of magnitude of storage and loss modulus). It also lets researchers investigate tension / compression properties of biological materials via a dynamic characterization mode that permits accurate measurement at each point during testing. Additional advantages include fast, accurate generation of real-time test results; improved understanding of strain-rate-sensitive materials and time-dependent response; improved statistical sampling in biomaterials applications; and automated reporting of test results in both Microsoft?Word and Excel.
Agilent T150 UTM
Data Sheet
Agilent T150 UTM.
Furthermore, decoupling load application from displacement sensing ensures that the measured response of material and loading mechanisms are independent. Users can therefore obtain
measurements that have minimal crosstalk between force on sample and displacement, thus reducing errors in measurements.
System Components
The T150 UTM includes a nanomechanical actuating
transducer head and a software-controlled, automated handset, as well as a fully automated data
The user-friendly design of the T150 UTM simpli? es training requirements — standard tests can be run on the same day the instrument is installed. Every T150 is backed by highly responsive Agilent Technologies customer service personnel. Knowledgeable and experienced regional applications engineers are available to guide users through more advanced testing, provide outstanding technical support, and offer
unmatched applications expertise.
Advanced Design
During tensile elongation, the T150 UTM holds the nanomechanical
actuating transducer head stationary and moves the crosshead, providing a very stable system that ensures the lowest noise ? oor. The
system allows the most accurate identi? cation of the critical tension point needed for data correlation during specimen elongation. The T150 also uses data before the
onset of tension on the sample with a software algorithm to accurately indentify the start of tension. The T150 UTM design has high lateral stiffness, attributable to a two-spring design that supports the indenter transducer so that it is restricted to 1 degree of freedom in motion (axis of indentation). The restriction of
movement enables the behavior of the instrument to more closely follow the dynamic model.
Utilizing core Agilent technology, loads are developed in the
micro-Newton ranges and strain measurements from nanoscale extensions of samples are possible. The nanomechanical actuating transducer head functions as a load cell by sending a precise amount of current to the actuator coil so that the specimen lower grip is maintained in the center.
Figure 1. The sensitivity of the T150 load cell enables small loads to be resolved at the upper and lower limits of adhesion in a 180 degree peel test con? guration. The graph of load on specimen vs extension demonstrates the ability to resolve adhesion forces to within a few mN and differentiate samples
acquisition and control system with PC, monitor, keyboard, color inkjet printer, and Agilent NanoSuite 5.0 Professional software — a powerful package that enables easy use of standard test methods and creation of unique solutions for automated, consistent results.
The T150 is equipped with a micropositioner stage, a helpful sample guide that ensures the sample is orthogonal and aids in the positioning of the upper grip. In addition, an indentation kit including an inversion footer is available allowing the system to be used as an indenter.
Crosshead driven at a speci?35 nm extension resolution
Grip
Spring
Coil (magnet)
Capacitive sensor
Continuous Dynamic Analysis (CDA) Option
The Agilent Continuous Dynamic Analysis (CDA) option offers a
direct, accurate measurement of the specimen’s stiffness at each point in the experiment, enabling mechanical properties to be determined continuously as the specimen is strained. By measuring both the amplitude and phase relationships between the load and displacement oscillations, CDA makes it possible to determine storage and loss modulus. The CDA option enables T150 UTM users to gain access to dynamic properties information continuously through the force curve, providing a wealth of information on the material’s response. The option also provides the advantage of measuring complex moduli over a range of frequencies.
New Powerful NanoSuite 5.0 Professional Software
Every T150 UTM comes with the Agilent NanoSuite 5.0 Professional software package. NanoSuite 5.0 lets users run tests and manage data with unprecedented ease. Through the elegant and intuitive interface, users can set up and run experiments quickly — changing test parameters as often as desired — with just a few clicks. Advanced features such as enhanced imaging capabilities and new test methods development that help researchers get from testing to results in record time.
NanoSuite 5.0 provides the power of real-time experimental control based on any recorded or calculated data
channel. This allows functionality such as plotting real-time properties, or more complex capabilities, such as responding intelligently when a test sample fails. The Professional version of NanoSuite 5.0 allows users access to various test methods written by Agilent applications engineers; each NanoSuite method is a software ? le that contains the instructions for performing a test, analyzing the data, and generating an easy-to-read printed report. Agilent is constantly developing and releasing new methods for T150 UTM users.
New Enhanced NanoSuite 5.0 Explorer Software
The Agilent NanoSuite 5.0 Explorer software package is offered as a T150 UTM option. The Explorer version of NanoSuite 5.0 enables researchers to write their own NanoSuite methods via a new, easier-to-use, method-creation protocol that
reduces the lines of code needed for customized test development. The variety of tests that can be designed within the NanoSuite environment is limited only by the researcher’s imagination. No other commercially available package offers this degree of ? exibility and control.
Nanoindentation instruments from Agilent Technologies conform
to the ISO 14577 standard, delivering con? dence in test accuracy and repeatability. These state-of-the-art solutions ensure reliable, high-precision measurement of nanomechanical properties for research and industry.
Figure 2. Miniaturized ? xture and accessories allow the T150 to be con? gured to perform classed 3 or 4 point bend, fatigue cycling and ? exural modulus test.
Crosshead moved only prior to load detection
Cyclic fatigue applied through XP Head
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Product speci? cations and descriptions in this document subject to change without notice.
? Agilent Technologies, Inc. 2009Printed in USA, July 14, 20095990-4206EN Rev A
Agilent T150 UTM Specifications
Maximum load 500 mN (50.8 gm) Load resolution 50 nN (5.1 μgm) Maximum actuating transducer displacement ±1 mm Displacement resolution <0.1 nm Dynamic displacement resolution <0.001 nm Maximum crosshead extension 150 mm Extension resolution 35 nm
Extension rate 0.5 μm/s to 5 mm/s Dynamic frequency range (sample dependent) 0.1 Hz to 2.5 kHz
CDA Option
Force amplitude range
0.1 μN to 4.5 mN Frequency range characterization of instrument dynamic response (sample dependent)
0.01 Hz to 200 Hz